Field-emission SEM imaging of compositional and doping layer semiconductor superlattices

Author： Perovic D.D.   Castell M.R.   Howie A.   Lavoie C.   Tiedje T.   Cole J.S.W.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.58, Iss.1, 1995-04, pp. : 104-113

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