High spatial resolution extended energy loss fine structure investigations of silicon dioxide compounds

Author: Zou W.Y.   Csillag S.   Tafreshi M.A.   Colliex C.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.59, Iss.1, 1995-07, pp. : 149-157

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Abstract