Author： Egerton R.F. Kaikee W.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.59, Iss.1, 1995-07, pp. : 169-180
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Abstract
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Delocalization in inelastic scattering
Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. :
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