Author: D. S.S. H. F.W. Zeitler E.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.59, Iss.1, 1995-07, pp. : 181-190
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Elemental occurrence maps: a starting point for quantitative EELS spectrum image processing
Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. :
EELS analysis of redox in glasses for plutonium immobilization
By Fortner J.A. Buck E.C. Ellison A.J.G. Bates J.K.
Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. :
Towards sub-nanometer scale EELS analysis of polymers in the TEM
By Varlot K. Martin J.M. Quet C. Kihn Y.
Ultramicroscopy, Vol. 68, Iss. 2, 1997-06 ,pp. :
Quantitative analysis of EFTEM elemental distribution images
By Hofer F. Grogger W. Kothleitner G. Warbichler P.
Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. :