A quantitative approach for spatially-resolved electron energy-loss spectroscopy of grain boundaries and planar defects on a subnanometer scale

Author： Hui G.   Ceh M.   Stemmer S.   Mullejans H.   Ruhle M.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.59, Iss.1, 1995-07, pp. : 215-227

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