The orthogonalized plane-wave method applied to the calculation of dynamical effects in electron diffraction

By Barreteau C.   Ducastelle F.  

Ultramicroscopy, Vol. 57, Iss. 1, 1995-01 ,pp. : 11-15

Elsevier

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Structure determination at the atomic level from dynamical electron diffraction data under systematic row conditions

By Allen L.J.   Oxley M.P.  

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Dynamical electron diffraction analysis of lattice parameters, Debye-Waller factors and order in Ti-Al and Ti-Ga alloys

By Rossouw C.J.   Gibson M.A.   Forwood C.T.  

Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 193-209

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Determination of absolute configurations of crystal structures using electron diffraction patterns by means of least-squares refinement

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Ultramicroscopy, Vol. 90, Iss. 4, 2002-04 ,pp. : 291-300

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Quantitative measurement of displacement and strain fields from HREM micrographs - Electron Diffraction Effects due to Modulated Structures

By Hytch M.J.   Snoeck E.   Kilaas R.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 131-146

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