Fabrication and characterization of optoelectronic near-field probes based on an SFM cantilever design

Author: Danzebrink H.U.   Ohlsson O.   Wilkening G.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.61, Iss.1, 1995-12, pp. : 131-138

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Abstract