The inverse scanning tunneling near-field microscope (ISTOM) or tunnel scanning near-field optical microscope (TSNOM) 3D simulations and application to nano-sources

Author: Barchiesi D.   Van Labeke D.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.61, Iss.1, 1995-12, pp. : 17-20

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Abstract