Correction of three-fold astigmatism for ultra-high-resolution TEM

Author: Overwijk M.H.F.   Bleeker A.J.   Thust A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.67, Iss.1, 1997-06, pp. : 163-170

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Abstract