Applications of orientation mapping by scanning and transmission electron microscopy

Author: Jensen D.J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.67, Iss.1, 1997-06, pp. : 25-34

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract