A spherical-aberration-corrected 200kV transmission electron microscope

By Haider M.   Rose H.   Uhlemann S.   Schwan E.   Kabius B.   Urban K.  

Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. : 53-60

Elsevier

Access to resources Recommend Favorite

Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1nm at 200kV

By Tsuno K.   Jefferson D.A.  

Ultramicroscopy, Vol. 72, Iss. 1, 1998-04 ,pp. : 31-39

Elsevier

Access to resources Recommend Favorite

A 200 kV electron microscope with Schottky field emitter and a helium-cooled superconducting objective lens

By Zemlin F.   Beckmann E.   van der Mast K.D.  

Ultramicroscopy, Vol. 63, Iss. 3, 1996-07 ,pp. : 227-238

Elsevier

Access to resources Recommend Favorite

Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy - Application au titanate de Plomb et aux semi-conducteur III-V, Ph.D. Thesis, EPFL

By Foeth M.   Stadelmann P.   Buffat P.-A.  

Ultramicroscopy, Vol. 75, Iss. 4, 1999-01 ,pp. : 203-213

Elsevier

Access to resources Recommend Favorite

Interpretable resolution of 0.2 nm at 100 kV using electron holography

By Harscher A.   Lang G.   Lichte H.  

Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. : 79-86

Elsevier

Access to resources Recommend Favorite