An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

Author： Anderson S.C.   Birkeland C.R.   Anstis G.R.   Cockayne D.J.H.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.69, Iss.2, 1997-09, pp. : 83-103

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