Author: Janssens K.G.F. Van der Biest O. Vanhellemont J. Maes H.E.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.69, Iss.3, 1997-10, pp. : 151-167
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Diffraction effects in electron spectroscopic imaging
By Schenner M. Nelhiebel M. Schattschneider P.
Ultramicroscopy, Vol. 65, Iss. 1, 1996-09 ,pp. :
An experimentally convenient configuration for electron channeling contrast imaging
Ultramicroscopy, Vol. 77, Iss. 1, 1999-05 ,pp. :
Quantitative phase-sensitive imaging in a transmission electron microscope
By Bajt S. Barty A. Nugent K.A. McCartney M. Wall M. Paganin D.
Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. :