Non-contact scanning probe microscopy with sub-piconewton force sensitivity

Author: Aoki T.   Hiroshima M.   Kitamura K.   Tokunaga M.   Yanagida T.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.70, Iss.1, 1997-12, pp. : 45-55

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Abstract