Author: Vincent R. Walsh T.D.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.70, Iss.1, 1997-12, pp. : 83-94
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Automated identification of symmetry in CBED patterns: a genetic approach
By Hu G.B. Peng L.-M. Yu Q.F. Lu H.Q.
Ultramicroscopy, Vol. 84, Iss. 1, 2000-07 ,pp. :
Effect of electron beam parameters on CBED patterns from interfaces
By Bokel R.M.J. Schapink F.W. Tichelaar F.D.
Ultramicroscopy, Vol. 75, Iss. 3, 1998-12 ,pp. :
Iterative phase retrieval from kinematic rocking curves in CBED patterns
By Vincent R. Walsh T.D. Pozzi M.
Ultramicroscopy, Vol. 76, Iss. 3, 1999-01 ,pp. :