Author： Ruiter A.G.T. van der Werf K.O. Veerman J.A. Garcia-Parajo M.F. Rensen W.H.J. van Hulst N.F.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 149-157
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