Are artefacts in scanning near-field optical microscopy related to the misuse of shear force? - Applied Sciences, Near-Field Optics

Author: Williamson R.L.   Brereton L.J.   Antognozzi M.   Miles M.J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 165-175

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Abstract