Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

By Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

Elsevier

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Multi-functional SNOM/AFM probe with accurately controlled low spring constant

By Muramatsu H.   Chiba N.   Yamamoto N.   Homma K.   Ataka T.   Shigeno M.   Monobe H.   Fujihira M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 73-79

Elsevier

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A novel STM-assisted microwave microscope with capacitance and loss imaging capability

By Imtiaz A.   Anlage S.M.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 209-216

Elsevier

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The Scanning Probe Microscope as a Novel Genomic Analysis Tool

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Nanobiotechnology, Vol. 1, Iss. 4, 2005-12 ,pp. : 369-378

Humana Press, Inc

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Contrast mechanisms in illumination-mode SNOM

By Valle P.J.   Carminati R.   Greffet J.-J.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 39-48

Elsevier

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