Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe Image interpretation and resolution for high topographic variations

By Barchiesi D.   Bergossi O.   Pieralli C.   Spajer M.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

Elsevier

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On the spatial resolution of uncoated optical-fiber probes in internal reflection near-field scanning optical microscopy

By Atia W.A.   Pilevear S.   Gungor A.   Davis C.C.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 379-382

Elsevier

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Apertureless near-field optical microscopy of metallic nanoparticles

By Pack A.   Grill W.   Wannemacher R.  

Ultramicroscopy, Vol. 94, Iss. 2, 2003-02 ,pp. : 109-123

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Optical near-field induced current microscopy

By Karrai K.   Kolb G.   Abstreiter G.   Schmeller A.  

Ultramicroscopy, Vol. 61, Iss. 1, 1995-12 ,pp. : 299-304

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Near-field optical microscopy at the liquid/air interface

By Seaver M.   Duncan M.D.   Frost A.E.  

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