Investigation of porous silicon morphology for electron emission applications

Author： Kleps I.   Nicolaescu D.   Garcia N.   Serena P.   Gil A.   Zlatkin A.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.73, Iss.1, 1998-06, pp. : 237-245

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Secondary electron emission and glow discharge properties of 12CaO·7Al2O3 electride for fluorescent lamp applications

By  

Science and Technology of Advanced Materials, Vol. 12, Iss. 3, 2011-06 ,pp. : 93-100

IOP Publishing

Access to resources Recommend Favorite

Chemical stabilization of porous silicon for enhanced biofunctionalization with immunoglobulin

By  

Science and Technology of Advanced Materials, Vol. 13, Iss. 4, 2012-08 ,pp. : 112-118

IOP Publishing

Access to resources Recommend Favorite

Porous hydroxyapatite for artificial bone applications

By  

Science and Technology of Advanced Materials, Vol. 8, Iss. 1-2, 2007-01 ,pp. : 116-123

IOP Publishing

Access to resources Recommend Favorite

Scattering of A-scale electron probes in silicon

By Dwyer C.   Etheridge J.  

Ultramicroscopy, Vol. 96, Iss. 3, 2003-09 ,pp. : 343-360

Elsevier

Access to resources Recommend Favorite

Asymmetries in electron Compton profiles of silicon - a coherence effect

By Exner A.   Schattschneider P.  

Ultramicroscopy, Vol. 65, Iss. 3, 1996-10 ,pp. : 131-145

Elsevier

Access to resources Recommend Favorite