Comparative REM and AFM investigations of the surface recovery of MBE-grown GaAs(001)-layers during annealing

Author： Kreutzer P.   Zacher T.   Naumann W.   Franke T.   Anton R.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.76, Iss.3, 1999-01, pp. : 107-114

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