Model-based two-object resolution from observations having counting statistics

Author: Bettens E.   Van Dyck D.   den Dekker A.J.   Sijbers J.   van den Bos A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.77, Iss.1, 1999-05, pp. : 37-48

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Abstract