Application of scanning tunneling-field emission microscopy for investigations of field electron emission from nanoscale diamond films

Author: Frolov V.D.   Karabutov A.V.   Pimenov S.M.   Obraztsova E.D.   Konov V.I.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.79, Iss.1, 1999-09, pp. : 209-215

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Abstract