Correction terms and approximations for atom location by channelling enhanced microanalysis - Proceedings EMAG '95, Institute of Physics Conference Series

Author： Oxley M.P.   Allen L.J.   Rossouw C.J.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.80, Iss.2, 1999-10, pp. : 109-124

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