On the resolution of semiconductor multilayers with a scanning electron microscope

By Merli P.G.   Migliori A.   Nacucchi M.   Govoni D.   Mattei G.  

Ultramicroscopy, Vol. 60, Iss. 2, 1995-09 ,pp. : 229-239

Elsevier

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Scanning and transmission electron microscope investigation of preferential thinning during ion beam milling of an Al-Ag alloy containing precipitate plates and the subsequent effects on microanalysis

By Moore K.T.   Howe J.M.   Csontos A.A.  

Ultramicroscopy, Vol. 76, Iss. 4, 1999-04 ,pp. : 195-202

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Transmission of through-the-lens Auger spectroscopy in an electron microscope

By van Veenendaal M.   den Hartog S.  

Ultramicroscopy, Vol. 90, Iss. 2, 2002-02 ,pp. : 113-119

Elsevier

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Quantitative phase-sensitive imaging in a transmission electron microscope

By Bajt S.   Barty A.   Nugent K.A.   McCartney M.   Wall M.   Paganin D.  

Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. : 67-73

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Backscattered electron contrast on cross sections of interfaces and multilayers in the scanning electron microscope

By Konkol A.   Booker G.R.   Wilshaw P.R.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 233-237

Elsevier

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