Analysis of electron intensity as a function of aperture size in energy-filtered transmission electron microscope imaging

Author: Moore K.T.   Howe J.M.   Veblen D.R.   Murray T.M.   Stach E.A.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.80, Iss.3, 1999-11, pp. : 221-236

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Abstract