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Ultramicroscopy, Vol. 80, Iss. 1, 1999-08 ,pp. : 1-5

Elsevier

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Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

By He W.Z.   Li F.H.   Chen H.   Kawasaki K.   Oikawa T.  

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Image-spectroscopy - II. The removal of plural scattering from extended energy-filtered series by Fourier deconvolution

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Electron radiation damage to protein crystals of bacteriorhodopsin at different temperatures

By Stark H.   Zemlin F.   Boettcher C.  

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Diffuse scattering in electron diffraction data from protein crystals

By Grigorieff N.   Henderson R.  

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