Probing molecular interactions and mechanical properties of microbial cell surfaces by atomic force microscopy

Author： Dufrene Y.F.   Boonaert C.J.P.   van der Mei H.C.   Busscher H.J.   Rouxhet P.G.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.86, Iss.1, 2001-01, pp. : 113-120

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