Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever

By Kawagishi T.   Kato A.   Hoshi Y.   Kawakatsu H.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 37-48

Elsevier

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A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy

By Gall-Borrut P.   Castagne M.   Weyher J.L.   Fillard J.P.   Bonnafe J.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 231-234

Elsevier

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Developments for inverted atomic force microscopy

By Mabry J.C.   Yau T.   Yap H.   Green J.-B.D.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 73-82

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Atomic force microscopy in analytical biotechnology

By Allen S.   Davies M.C.   Roberts C.J.   Tendler S.J.B.   Williams P.M.  

Trends in Biotechnology, Vol. 15, Iss. 3, 1997-03 ,pp. : 101-105

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Self-sensing piezoresistive cantilever and its magnetic force microscopy applications

By Takahashi H.   Ando K.   Shirakawabe Y.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 63-72

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