Impact of column bending in high-resolution transmission electron microscopy on the strain evaluation of GaAs/InAs/GaAs heterostructures

By Tillmann K.   Lentzen M.   Rosenfeld R.  

Ultramicroscopy, Vol. 83, Iss. 1, 2000-05 ,pp. : 111-128

Elsevier

Access to resources Recommend Favorite

Compositional information from amorphous Si-Ge multilayers using high-resolution electron microscopy imaging and direct digital recording

By Henning P.   Wallenberg L.R.   Jarrendahl K.   Hultman L.   Falk L.K.L.   Sundgren J.-E.  

Ultramicroscopy, Vol. 66, Iss. 3, 1996-12 ,pp. : 221-235

Elsevier

Access to resources Recommend Favorite

An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

By Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.  

Ultramicroscopy, Vol. 58, Iss. 2, 1995-05 ,pp. : 131-155

Elsevier

Access to resources Recommend Favorite

An approximate multi-beam form of the ''ellipse'' in high-resolution transmission electron microscopy

By Hu J.J.   Tanaka N.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 105-111

Elsevier

Access to resources Recommend Favorite

Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

By He W.Z.   Li F.H.   Chen H.   Kawasaki K.   Oikawa T.  

Ultramicroscopy, Vol. 70, Iss. 1, 1997-12 ,pp. : 1-11

Elsevier

Access to resources Recommend Favorite