Development of a quantitative energy filtering TEM method to study a reactive NiO/ 80 Ni 20 Fe interface

Author： Bayle-Guillemaud P.   Barbier A.   Mocuta C.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.88, Iss.2, 2001-07, pp. : 99-110

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