Measurement of surface orientation in uniaxial poly(ethylene terephthalate) films using polarised specular reflectance Fourier transform infrared microscopy

Author: Everall N.J.   Chalmers J.M.   Local A.   Allen S.  

Publisher: Elsevier

ISSN: 0924-2031

Source: Vibrational Spectroscopy, Vol.10, Iss.2, 1996-01, pp. : 253-259

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