Scanning Near-Field Raman Microscopy on Ferroelectrics

By Sakai Akira   Sasaki Naoto   Tamate Tomoyuki   Ninomiya Takanori  

Ferroelectrics, Vol. 284, Iss. 1, 2003-06 ,pp. : 15-19

Taylor & Francis Ltd

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Interferometric probe for near-field optical microscopy systems

By Kul’chin Yu.   Vitrik O.   Bezverbnyi A.   Dyshlyuk A.   Kuchmizhak A.  

Technical Physics Letters, Vol. 36, Iss. 7, 2010-07 ,pp. : 599-601

MAIK Nauka/Interperiodica

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Nanometer scale-electrochromic modification of NiO films using a novel technique of scanning near-field optical microscopy

By Iwata F.   Mikage K.   Sakaguchi H.   Kitao M.   Sasaki A.  

Solid State Ionics, Vol. 165, Iss. 1, 2003-12 ,pp. : 7-13

Elsevier

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Towards the fluorescence resonance energy transfer (FRET) scanning near-field optical microscopy: Investigation of nanolocal FRET processes and FRET probe microscope

By Sekatskii S.   Shubeita G.   Chergui M.   Dietler G.   Mironov B.   Lapshin D.   Letokhov V.  

Journal of Experimental and Theoretical Physics, Vol. 90, Iss. 5, 2000-05 ,pp. : 769-777

MAIK Nauka/Interperiodica

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Scattering simulations in inhomogenous volumes for scanning near-field optical microscopy

By Humphries Stanley  

Journal of Modern Optics, Vol. 47, Iss. 5, 2000-04 ,pp. : 805-820

Taylor & Francis Ltd

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