Author: Varshney R. Grosse I. Hähnel U. Siefken R. Prasad M. Stein N. Langridge P. Altschmied L. Graner A.
Publisher: Springer Publishing Company
ISSN: 0040-5752
Source: Theoretical and Applied Genetics, Vol.113, Iss.2, 2006-07, pp. : 239-250
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