Author： Shpan'ko I.V.
Publisher： Springer Publishing Company
ISSN： 0040-5760
Source： Theoretical and Experimental Chemistry, Vol.37, Iss.1, 2001-01, pp. : 23-27
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The Study of Parameters of Surface Roughness by the Correlation Analysis
Materials Science Forum, Vol. 2015, Iss. 818, 2015-06 ,pp. :
Access to resources
Recommend
Use of databases in the kinetic analysis of two competitive, consecutive second-order reactions
By Reich L.
Thermochimica Acta, Vol. 293, Iss. 1, 1997-06 ,pp. :
Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis
By Dulot F. Kierren B. Malterre D.
Thin Solid Films, Vol. 423, Iss. 1, 2003-01 ,pp. :
By Tomashevitch K.V. Kalinin S.V. Vertegel A.A. Oleinikov N.N. Ketsko V.A. Tretyakov Y.D.
Thermochimica Acta, Vol. 323, Iss. 1, 1998-12 ,pp. :