Author: Bogomol'nyi V.M.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.43, Iss.11, 2000-11, pp. : 973-981
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Oscillating Structure Defects in Dielectric Diodes
Measurement Techniques, Vol. 45, Iss. 10, 2002-10 ,pp. :
By Voropaev V. Ganin S. Kostromin V. Popov M.
Measurement Techniques, Vol. 47, Iss. 9, 2004-09 ,pp. :