Calculation of the Critical Parameters of Self-Exciting Processes in the Electrothermal Destruction of Dielectric Diodes

Author: Bogomol'nyi V.M.  

Publisher: Springer Publishing Company

ISSN: 0543-1972

Source: Measurement Techniques, Vol.43, Iss.11, 2000-11, pp. : 973-981

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract