Analytical Investigation of the Influence of the Structural Parameters of the Optoelectronic Path of a Thermal-Imaging Device on Its Characteristics

Author： Krutikov V.N.  

Publisher： Springer Publishing Company

ISSN： 0543-1972

Source： Measurement Techniques, Vol.46, Iss.2, 2003-02, pp. : 128-135

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Performance parameters for thermal imaging systems

By Venkataraman B   Raj Baldev  

Insight - Non-Destructive Testing and Condition Monitoring, Vol. 45, Iss. 8, 2003-08 ,pp. : 531-535

The British Institute of Non-Destructive Testing

Access to resources Recommend Favorite

Analytical Investigation and Estimation of Errors Involved in the Problem of Measuring the Parameters of a Harmonic Signal Using the Fourier Transform Method

By Khanyan G.S.  

Measurement Techniques, Vol. 46, Iss. 8, 2003-08 ,pp. : 723-735

Springer Publishing Company

Access to resources Recommend Favorite

Modeling the optimal parameters for a remote sensing device

By Bushmeleva K.  

Measurement Techniques, Vol. 54, Iss. 3, 2011-06 ,pp. : 294-299

Springer Publishing Company

Access to resources Recommend Favorite

Multiple-Response Models for Calculating Electronic Device Parameters

By Popov S.A.   Korchagin A.F.  

Measurement Techniques, Vol. 46, Iss. 4, 2003-04 ,pp. : 391-396

Springer Publishing Company

Access to resources Recommend Favorite

Recent Progress in p-Type Doping and Optical Properties of SnO2 Nanostructures for Optoelectronic Device Applications

By  

Recent Patents on Nanotechnology, Vol. 5, Iss. 2, 2011-06 ,pp. : 138-161

Bentham Science Publishers

Access to resources Recommend Favorite