Author： Dvoryankin V.F. Dikaev Y.M. Kudryashov A.A. Sokolovskii A.A.
Publisher： Springer Publishing Company
ISSN： 0543-1972
Source： Measurement Techniques, Vol.46, Iss.8, 2003-08, pp. : 806-809
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Abstract
A method is described for determining the instantaneous effective energy of x-ray tube brehmsstrahlung by means of two semiconductor detectors employing epitaxial GaAs structures and a measurement circuit, which together determine the effective energy with an error of 5% in the range 20–80 keV in the presence of nonlinearity in the detector response.
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