Author: Suchkov G.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.48, Iss.3, 2005-03, pp. : 255-259
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Analysis of a method of measuring the S -parameters of microwave transistors
By Ryasnyi Yu.
Measurement Techniques, Vol. 55, Iss. 10, 2013-01 ,pp. :