Author: Korchevskii V.
Publisher: Springer Publishing Company
ISSN: 0543-1972
Source: Measurement Techniques, Vol.49, Iss.3, 2006-03, pp. : 296-300
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Abstract
The use of numerical methods to estimate the components of the instrumental and systematic errors of measurements of the parameters of a crystal structure using an x-ray diffractometer is considered. The criteria for using standard samples to eliminate instrumental errors are established.
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