Certified Reference Tables on Decay Characteristics and Radiations of Radionuclides Used to Calibrate Semiconductor Spectrometers for Photon Radiation in the Energy Range 5–140 keV

By Chechev V. P.  

Measurement Techniques, Vol. 46, Iss. 12, 2003-12 ,pp. : 1202-1206

Springer Publishing Company

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The development of a super-stable datum point for monitoring the energy scale of electron spectrometers in the energy range up to 20 keV

By Vénos D.  

Measurement Techniques, Vol. 53, Iss. 3, 2010-07 ,pp. : 305-312

Springer Publishing Company

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Erratum to: “Development of a Super-Stable Datum Point for Monitoring the Energy Scale of Electron Spectrometers in the Energy Range up to 20 keV” by D. Vénos, M. Zbořil, J. Kašpar, O. Dragoun, J. Bonn, A. Kovalík, O. Lebeda, N. A. Lebedev, M. Ryšavý, K. Schlösser, A. Špalek, and Ch. Weinheimer, Vol. 53, No. 3, pp. 305–312, July, 2010

By Vénos D.  

Measurement Techniques, Vol. 53, Iss. 5, 2010-09 ,pp. : 573-581

Springer Publishing Company

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Recent Patents on C-V Profiling of Heterostructures Based on Narrow-Gap Semiconductor ZnCdHgTe

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Recent Patents on Electrical & Electronic Engineering (Formerly Recent Patents on Electrical Engineering), Vol. 2, Iss. 3, 2009-11 ,pp. : 239-244

Bentham Science Publishers

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Qualitative Determination of the Degree of Doping of Commercial SnO2 Semiconductor Sensors from the Nature of Their Reaction with Hydrogen

By Dramlich D.M.   Popovich M.M.  

Measurement Techniques, Vol. 44, Iss. 5, 2001-05 ,pp. : 552-554

Springer Publishing Company

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