Author: Kranitis N.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.17, Iss.2, 2001-04, pp. : 97-107
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
An effective logic BIST scheme based on LFSR-reseeding and TVAC
International Journal of Electronics, Vol. 101, Iss. 9, 2014-09 ,pp. :
A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
Journal of Electronic Testing, Vol. 22, Iss. 4-6, 2006-12 ,pp. :