Replacing I DDQ Testing: With Variance Reduction

By Thibeault C.  

Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. : 325-340

Springer Publishing Company

Access to resources Recommend Favorite

Design and Realization of a Built-In Current Sensor for I_DDQ Testing and Power Dissipation Measurement

By Arabi K.  

Analog Integrated Circuits and Signal Processing, Vol. 23, Iss. 2, 2000-05 ,pp. : 117-126

Springer Publishing Company

Access to resources Recommend Favorite

Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta I DDQ Testing

By Semenov O.  

Journal of Electronic Testing, Vol. 19, Iss. 3, 2003-06 ,pp. : 341-352

Springer Publishing Company

Access to resources Recommend Favorite

Faster column operations in star networks

By Bagherzadeh Nader   Dowd Martin   Latifi Shahram  

Telecommunication Systems, Vol. 10, Iss. 1-2, 1998-10 ,pp. : 33-44

Springer Publishing Company

Access to resources Recommend Favorite

A faster power MOSFET device with electrical stress treatment

By Salame C.   Habchi R.   Tazibt W.   Khoury A.   Mialhe P.  

Microelectronics International, Vol. 22, Iss. 2, 2005-08 ,pp. : 35-37

Emerald Group Publishing Ltd

Access to resources Recommend Favorite