IC Cost Reduction by Applying Embedded Fault Tolerance for Soft Errors: On-line Testing (Guest Editors: Cecilia Metra and Matteo Sonza Reorda)

Author: Nieuwland André K.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.20, Iss.5, 2004-10, pp. : 533-542

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