Author: Das Sukanta
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.21, Iss.1, 2005-02, pp. : 95-107
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
LFSR-Based Deterministic TPG for Two-Pattern Testing
By Li X.
Journal of Electronic Testing, Vol. 16, Iss. 5, 2000-10 ,pp. :
A New Built-in TPG Based on Berlekamp-Massey Algorithm
Journal of Electronic Testing, Vol. 26, Iss. 4, 2010-08 ,pp. :