Author: Testa Luca
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.26, Iss.3, 2010-06, pp. : 355-365
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By He Jin Zhang Xing Wang Yang Yuan
International Journal of Electronics, Vol. 88, Iss. 8, 2001-08 ,pp. :
A wafer fault diagnosis scheme
By Song Xiaoyu
International Journal of Electronics, Vol. 87, Iss. 12, 2000-12 ,pp. :