Tandem Mass Spectrometry of Heparan Sulfate Negative Ions: Sulfate Loss Patterns and Chemical Modification Methods for Improvement of Product Ion Profiles

Author: Shi Xiaofeng  

Publisher: Springer Publishing Company

ISSN: 1044-0305

Source: Journal of The American Society for Mass Spectrometry, Vol.23, Iss.9, 2012-09, pp. : 1498-1511

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