In situ atomic force microscopy studies of electrodeposition mechanism of cerium oxide films: nucleation and growth out of a gel mass precursor

Author: Li F.-B.   Newman R.C.   Thompson G.E.  

Publisher: Elsevier

ISSN: 0013-4686

Source: Electrochimica Acta, Vol.42, Iss.16, 1997-01, pp. : 2455-2464

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Abstract