Microscopic detection of light-induced electron transfer in molecular assembly system using scanning Maxwell stress microscopy (SMM)

Author： Hirata Y.   Mizutani F.   Yokoyama H.  

Publisher： Elsevier

ISSN： 0013-4686

Source： Electrochimica Acta, Vol.45, Iss.18, 2000-06, pp. : 2953-2959

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