Structural characterization of organic monolayers on Si<111> from capacitance measurements

Author: Allongue P.   Henry de Villeneuve C.   Pinson J.  

Publisher: Elsevier

ISSN: 0013-4686

Source: Electrochimica Acta, Vol.45, Iss.20, 2000-06, pp. : 3241-3248

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Abstract